Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation
electron microscopy
journal article
Citation (APA 7)
Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation P. M. Pelz, I. Johnson, C. Ophus, P. Ercius, M. C. Scott IEEE Signal Processing Magazine 39, 25-31
Abstract
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