Multi-slice electron ptychographic tomography for three-dimensional phase-contrast microscopy beyond the depth of focus limits
Citation (APA 7)
Multi-slice electron ptychographic tomography for three-dimensional phase-contrast microscopy beyond the depth of focus limits A. Romanov, M. G. Cho, M. C. Scott, P. Pelz Journal of Physics: Materials 8, 015005
Abstract
Electron ptychography is a powerful computational method for atomic-resolution imaging with high contrast for weakly and strongly scattering elements. Modern algorithms coupled with fast and efficient detectors allow imaging specimens with tens of nanometers thicknesses with sub-0.5 Ångstrom lateral resolution. However, the axial resolution in these approaches is currently limited to a few nanometers, limiting their ability to solve novel atomic structures ab initio. Here, we experimentally demonstrate multi-slice ptychographic electron tomography, which allows atomic resolution three-dimensional phase-contrast imaging in a volume surpassing the depth of field limits. We reconstruct tilt-series 4D-STEM measurements of a