3D Imaging Using HAADF-STEM and HRTEM Atomic Electron Tomography

electron microscopy
tomography
atomic resolution
imaging
Author

C. Ophus, D. Ren, J. Zhou, H. Devyldere, M. Chen, P. M. Pelz, P. Ercius, J. Miao, M. Scott, L. Waller

Doi

10.1017/s1431927619002708

Keywords

High-resolution transmission electron microscopy, Electron tomography, Scanning transmission electron microscopy

Citation (APA 7)

3D Imaging Using HAADF-STEM and HRTEM Atomic Electron Tomography C. Ophus, D. Ren, J. Zhou, H. Devyldere, M. Chen, P. M. Pelz, P. Ercius, J. Miao, M. Scott, L. Waller Microscopy and Microanalysis 25, 394-395

Abstract

  1. NCEM, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA. 2. Dept. of Electrical Engineering and Computer Sciences, Univ. of California Berkeley, Berkeley, USA. 3. Dept. of Physics and Astronomy, Univ. of California Los Angeles, Los Angeles, USA. 4. Dept. of Materials Science and Engineering, Univ. of California Berkeley, Berkeley, USA. * Corresponding author: cophus@gmail.com