Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning
phase contrast imaging, depth sectioning, thick samples, heterogeneous samples
Citation (APA 7)
Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning P. Pelz, H. Brown, S. Findlay, M. Scott, J. Ciston, C. Ophus Microscopy and Microanalysis 26, 462-464
Abstract
Three-dimensional phase-contrast imaging of thick, multiply scattering samples in electron microscopy requires the inversion of the paraxial Schroedinger equation for fast electrons which describes the propagation of coherent high-energy electrons in an electrostatic potential. The most prominent method for calculating a coherent exit-wave from a multiple-scattering sample is the multi-slice algorithm [1]. Due to its popularity for forward calculations, the inverse multi-slice algorithm has mostly been used in algorithms for inverting the scattering process, to retrieve a sample structure from measured intensities in real [2,4] or Fourier space [3,4,5].