Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation

electron microscopy

imaging

journal article

Author

P. M. Pelz, I. Johnson, C. Ophus, P. Ercius, M. C. Scott

Doi

10.1109/MSP.2021.3120981

Citation (APA 7)

Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation P. M. Pelz, I. Johnson, C. Ophus, P. Ercius, M. C. Scott IEEE Signal Processing Magazine 39, 25-31

Abstract

[Abstract will be added manually]