Achieving High-resolution of Large Specimens Using Aberration-corrected Tomography
Tomography
Citation (APA 7)
Achieving High-resolution of Large Specimens Using Aberration-corrected Tomography R. Yalisove, S. H. Sung, J. Schwartz, C. Groschner, P. Pelz, H. Zheng, Y. Jiang, C. Ophus, M. Scott, P. Ercius, R. Hovden Microscopy and Microanalysis 26, 1860-1862
Abstract
Aberration-corrected electron microscopy can resolve the smallest atomic bond-lengths in nature [1-3]. However, the high-convergence angles that enable spectacular resolution in 2D can only achieve limited 3D atomic resolution for all but the smallest objects (c.a. 5 - 10 nm). We show aberration-corrected electron tomography can offer new limits to 3D imaging by sampling several focal planes at each specimen tilt. We present a theoretical foundation for aberration-corrected electron tomography by establishing analytic descriptions for resolution, sampling, object size, and dose—with direct analogy to the Crowther-Klug criterion. 2D resolving power to 3D objects >