A faster image simulation algorithm for scanning transmission electron microscopy
electron microscopy
software
imaging
computational
scanning transmission electron microscopy
image simulation
fourier interpolation
beamlets
natural neighbor interpolation
simulation acceleration
Keywords
scanning transmission electron microscopy, image simulation, Fourier interpolation, beamlets, natural neighbor interpolation, simulation acceleration
Citation (APA 7)
A faster image simulation algorithm for scanning transmission electron microscopy P. Pelz, L. DaCosta, A. M. Rakowski, M. Scott, C. Ophus Microscopy and Microanalysis 27, 1272-1275
Abstract
Image simulations are an integral part of research in scanning transmission electron microscopy (STEM), yet large-scale simulations can still require extended simulation times, and can quickly become infeasible.