A faster image simulation algorithm for scanning transmission electron microscopy

electron microscopy

software

imaging

computational

Author

P. Pelz, L. DaCosta, A. M. Rakowski, M. Scott, C. Ophus

Doi

10.1017/s1431927621004773

Keywords

Transmission electron microscopy, Scanning transmission electron microscopy

Citation (APA 7)

A faster image simulation algorithm for scanning transmission electron microscopy P. Pelz, L. DaCosta, A. M. Rakowski, M. Scott, C. Ophus Microscopy and Microanalysis 27, 1272-1275

Abstract

Image simulations are an integral part of research in scanning transmission electron microscopy (STEM), yet large-scale simulations can still require extended simulation times, and can quickly become infeasible.