A faster image simulation algorithm for scanning transmission electron microscopy

electron microscopy

software

imaging

computational

transmission electron microscopy

scanning transmission electron microscopy

Author

P. Pelz, L. DaCosta, A. M. Rakowski, M. Scott, C. Ophus

Doi

10.1017/s1431927621004773

Keywords

Transmission electron microscopy, Scanning transmission electron microscopy

Citation (APA 7)

A faster image simulation algorithm for scanning transmission electron microscopy P. Pelz, L. DaCosta, A. M. Rakowski, M. Scott, C. Ophus Microscopy and Microanalysis 27, 1272-1275

Abstract

Image simulations are an integral part of research in scanning transmission electron microscopy (STEM), yet large-scale simulations can still require extended simulation times, and can quickly become infeasible.