Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation

electron microscopy

imaging

journal article

4d-stem

phase contrast imaging

direct electron detectors

scanning transmission electron microscopy

windowing

diffraction patterns

Author

P. M. Pelz, I. Johnson, C. Ophus, P. Ercius, M. C. Scott

Doi

10.1109/msp.2021.3120981

Keywords

4D-STEM, phase contrast imaging, direct electron detectors, scanning transmission electron microscopy, windowing, diffraction patterns

Citation (APA 7)

Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation P. M. Pelz, I. Johnson, C. Ophus, P. Ercius, M. C. Scott IEEE Signal Processing Magazine 39, 25-31

Abstract

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