Qualitative Phase Contrast Imaging using Interferometric 4DSTEM

electron microscopy
imaging
phase contrast imaging
differential phase contrast
ptychography
low-z materials
Author

A. Ducharme, P. Pelz, L. Brown, P. Ercius, B. McMorran

Doi
Keywords

phase contrast imaging, differential phase contrast, ptychography, low-Z materials

Citation (APA 7)

Qualitative Phase Contrast Imaging using Interferometric 4DSTEM A. Ducharme, P. Pelz, L. Brown, P. Ercius, B. McMorran Microscopy and Microanalysis 28, 2504-2505

Abstract

Phase contrast imaging has been implemented inside the TEM column in the last decade at atomic resolution through differential phase contrast (DPC) and ptychography [1-2]. This imaging mode has higher contrast than more direct TEM imaging techniques, unlocking measurements of low Z and 2D materials and nanoscale electric fields [3-4]. Another route to phase contrast imaging is through structuring the electron beam prior to sample interaction, such as in MIDI-STEM [5]