Using 4D-STEM to measure the nanoscale structure of materials in two and three dimensions

electron microscopy

nanoparticles

materials science

Author

C. Ophus, P. M. Pelz, H. A. Sternlict, B. H. Savitzky, A. Rakowski, A. Bruefach, S. Ribet, M. S. Scott

Doi

10.1107/s2053273323093609

Keywords

Nanoscopic scale

Citation (APA 7)

Using 4D-STEM to measure the nanoscale structure of materials in two and three dimensions C. Ophus, P. M. Pelz, H. A. Sternlict, B. H. Savitzky, A. Rakowski, A. Bruefach, S. Ribet, M. S. Scott Acta Crystallographica Section A Foundations and Advances 79, C251-C251

Abstract

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