Using 4D-STEM to measure the nanoscale structure of materials in two and three dimensions
electron microscopy
nanoparticles
materials science
4d-stem
nanostructures
3d imaging
two-dimensional imaging
electron diffraction
aberration-corrected electron microscopy
Keywords
4D-STEM, nanostructures, 3D imaging, two-dimensional imaging, electron diffraction, aberration-corrected electron microscopy
Citation (APA 7)
Using 4D-STEM to measure the nanoscale structure of materials in two and three dimensions C. Ophus, P. M. Pelz, H. A. Sternlict, B. H. Savitzky, A. Rakowski, A. Bruefach, S. Ribet, M. S. Scott Acta Crystallographica Section A Foundations and Advances 79, C251-C251
Abstract
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