High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography

ptychography
tomography
imaging
electron ptychography
phase contrast imaging
depth of field
4d-stem
tilt series reconstruction
single-atom resolution
Author

A. V. Romanov, M. G. Cho, M. C. Scott, C. Ophus, P. Pelz

Doi

10.48550/arxiv.2311.02580

Keywords

electron ptychography, phase contrast imaging, depth of field, 4D-STEM, tilt series reconstruction, single-atom resolution

Citation (APA 7)

High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography A. V. Romanov, M. G. Cho, M. C. Scott, C. Ophus, P. Pelz arXiv (Cornell University)

Abstract

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