Towards in-situ 4D-STEM observation of texture evolution in nano-crystalline thin films

Keywords

In situ, Nano-

Citation (APA 7)

Towards in-situ 4D-STEM observation of texture evolution in nano-crystalline thin films M. Wu, C. Hsieh, D. Stroppa, P. Pelz, C. Ophus, P. Lu, R. Dunin-Borkowski, C. Harreiss, P. Denninger, E. Spiecker BIO Web of Conferences 129, 07006

Abstract

Texture describes the preferred orientation of grains in crystalline materials, which dictates their anisotropic, for example, (opto-)electronic, thermal transport, and mechanical properties. The texture is evaluated conventionally by probing the reciprocal space using X-ray and/or electron diffraction methods, where spatial information, e.g., the orientation relationship of particular grains, is hardly accessible. Probing the local diffraction pattern with a focused electron beam, i