Sub-Ångstrom 3D Resolution, Volume Imaging Beyond the Depth of Focus Limit, and Automated Tomography Using Electron Ptychography

ptychography

tomography

atomic resolution

imaging

electron ptychography

3d electron microscopy

sub-angstrom resolution

depth of focus

missing wedge

tellurium nanoparticles

Author

P. Pelz, S. You, M. Wu, N. Palatkin

Doi

10.1093/mam/ozaf048.041

Keywords

electron ptychography, 3D electron microscopy, sub-angstrom resolution, depth of focus, missing wedge, tellurium nanoparticles

Citation (APA 7)

Sub-Ångstrom 3D Resolution, Volume Imaging Beyond the Depth of Focus Limit, and Automated Tomography Using Electron Ptychography P. Pelz, S. You, M. Wu, N. Palatkin Microscopy and Microanalysis 31

Abstract

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