Skip to main content

Lecture Data Science for Electron Microscopy WS 26/27

Author
Affiliation

Philipp Pelz

FAU Erlangen-Nuernberg

Published

September 27, 2026

Other Formats
Abstract

This is the website for the Data Science for Electron Microscopy Lecture

Keywords

Data Science, Electron Microscopy

Github Code

Studon Link

1 Course overview

One 90-minute lecture per week plus one self-study Jupyter notebook per week (runs on a laptop CPU or in Google Colab). Electron microscopy is the application thread throughout: every method is introduced on EM images, spectra, diffraction data or tilt series. Lectures are on Fridays; rooms are announced on StudOn.

Assessment: miniproject (40%, reproducible notebook + short report) and written exam (60%).

2 Week 1: Python crash course & the EM data deluge (23.10.2026)

3 Week 2: Learning from EM data: signal formation, noise & loss (30.10.2026)

4 Week 3: Linear algebra, PCA & spectral unmixing (06.11.2026)

5 Week 4: Regression, optimisation & honest validation (13.11.2026)

6 Week 5: From images to features: descriptors & tree ensembles (20.11.2026)

7 Week 6: Neural networks & backpropagation (27.11.2026)

8 Week 7: CNNs & U-Nets for microscopy (04.12.2026)

9 Week 8: Small data: augmentation, transfer & self-supervision (11.12.2026)

10 Week 9: Unsupervised learning, autoencoders & latent spaces (18.12.2026)

11 Week 10: Attention, transformers & graph networks for EM (08.01.2027)

12 Week 11: Uncertainty, Gaussian processes & autonomous EM (15.01.2027)

13 Week 12: Inverse problems I: regularisation, tomography & sensor fusion (22.01.2027)

14 Week 13: Inverse problems II: ptychography, generative priors & synthesis (29.01.2027)

15 Exam revision (05.02.2027)

  • Repetition and preparation for the exam, based on the must-know list

16 Miniproject

Apply the full pipeline from the course (data → model → uncertainty → explainability) to an electron-microscopy or materials-characterisation dataset, as a fully reproducible notebook plus a 4–6 page report. Choose one of five options:

A. STEM/SEM image segmentation (U-Net or foundation-model features) B. Spectral denoising and phase clustering (PCA / NMF / VAE) C. Materials property regression with honest validation and uncertainty D. A small imaging inverse problem (deblurring or limited-angle tomography) E. Atom-column descriptors and defect classification (tree ensembles, optionally a GNN)

Milestones: topic selection from Week 1, proposal around Week 6, progress check-in around Week 10, final submission in the exam period. The full task descriptions and grading rubric are on StudOn.

Archive: SS 25 lectures

The previous (9-lecture) version of the course is kept here for reference.

16.1 Lecture 1: Intro (13.05.2025)

16.2 Lecture 2: Optimization, Regression, Sensor Fusion (20.05.2025)

16.3 Lecture 3: CNNs (03.06.2025)

16.4 Lecture 4: Classification, Segmentation, AutoEncoders (10.06.2025)

16.5 Miniproject (10.6. - 24.6.2025) concurrent to lectures

In the miniproject, you will test multiple deep neural network architectures on one of four microscopy-related tasks. You should summarize your results in a short presentation (5 minutes + 2 minutes discussion) and deliver a Jupyter Notebook with your code and results. The miniproject will be graded and will count as 40% towards your final grade.

  1. Segmentation Task

    We will use the HRTEM dataset from “A robust synthetic data generation framework for machine learning in high-resolution transmission electron microscopy (HRTEM)” by Rangel DaCosta et al. (2024) to implement a segmentation model. The goal is to segment nanoparticles in HRTEM images.

    Please use the article “A robust synthetic data generation framework for machine learning in high-resolution transmission electron microscopy (HRTEM)” by Rangel DaCosta et al. (2024) as a starting point for your implementation.

    The datast contains pairs of HRTEM images and ground truth segmentations.

  2. VAE & Dimensionality Reduction

    We will use the dataset from “Uncovering material deformations via machine learning combined with four-dimensional scanning transmission electron microscopy” by Shi et al. (2022) to implement a dimensionality reduction model and cluster 4DSTEM data.

    The goal is to learn a mapping from 4DSTEM data to a lower-dimensional embedding where you can perform clustering to identify different deformation modes.

    Please use the article “Uncovering material deformations via machine learning combined with four-dimensional scanning transmission electron microscopy” by Shi et al. (2022) as a starting point for your implementation.

  3. Denoising

    We will use the dataset from “Unsupervised deep denoising for four-dimensional scanning transmission electron microscopy” by Sadri et al. (2024) to implement a denoising model for 4DSTEM data.

    The goal is to learn a mapping from noisy to clean 4DSTEM data.

    Please use the article “Unsupervised deep denoising for four-dimensional scanning transmission electron microscopy” by Sadri et al. (2024) as a starting point for your implementation.

    The article contains pytorch code for the model.

    Learn how to adapt it to your needs and try to replicate the results on the SrTiO3_High_mag_Low_dose.npy and SrTiO3_High_mag_High_dose.npy datasets.

  4. Image-to-Image Translation

    We will use a simulated X-ray image dataset with pairs of projected thickness and phase contrast images to implement an Image to image translation model.

    The goal is to learn a mapping from phase contrast images to projected thickness images.

    This is usually a task that is solved with multiple measurements and a physical model of the imaging process.

    Here we will try to learn this mapping from simulated data. Please use the article “Multi-resolution convolutional neural networks for inverse problems” by Wang et al. (2020) as a starting point for your implementation.

16.6 Lecture 5: Mixed Bag (24.06.2025)

16.7 Lecture 6: Gaussian Processes Introduction (01.07.2025)

16.8 Lecture 7: Gaussian Processes Applications (08.07.2025)

16.9 Lecture 8: Imaging Inverse Problems 1 (15.07.2025)

16.10 Lecture 9: Imaging Inverse Problems 2 (22.07.2025)

References

Rangel DaCosta, Luis, Katherine Sytwu, CK Groschner, and MC Scott. 2024. “A Robust Synthetic Data Generation Framework for Machine Learning in High-Resolution Transmission Electron Microscopy (HRTEM).” Npj Computational Materials 10 (1): 165.
Sadri, Alireza, Timothy C Petersen, Emmanuel WC Terzoudis-Lumsden, Bryan D Esser, Joanne Etheridge, and Scott D Findlay. 2024. “Unsupervised Deep Denoising for Four-Dimensional Scanning Transmission Electron Microscopy.” Npj Computational Materials 10 (1): 243.
Shi, Chuqiao, Michael C Cao, Sarah M Rehn, et al. 2022. “Uncovering Material Deformations via Machine Learning Combined with Four-Dimensional Scanning Transmission Electron Microscopy.” Npj Computational Materials 8 (1): 114.
Wang, Feng, Alberto Eljarrat, Johannes Müller, Trond R Henninen, Rolf Erni, and Christoph T Koch. 2020. “Multi-Resolution Convolutional Neural Networks for Inverse Problems.” Scientific Reports 10 (1): 5730.

Citation

BibTeX citation:
@online{pelz2026,
  author = {Pelz, Philipp},
  title = {Lecture {Data} {Science} for {Electron} {Microscopy} {WS}
    26/27},
  date = {2026-09-27},
  langid = {en},
  abstract = {This is the website for the Data Science for Electron
    Microscopy Lecture}
}
For attribution, please cite this work as:
Pelz, Philipp. 2026. “Lecture Data Science for Electron Microscopy WS 26/27.” Friedrich-Alexander Universitaet Erlangen-Nuernberg, September 27.